SIG2D™

Overview

SIG2D™ (2-Dimensional Signature Prediction/Radar Cross Section Analysis Code) is a surface integral computer code for radar cross section analysis of objects that exhibit two-dimensional translational symmetry.

Applications

SIG2D is designed for problems which can readily be characterized as a combination of piecewise homogeneous bulk materials, metal surfaces, impedance boundary surfaces, and shunt impedance surfaces. The bulk materials may have arbitrary values of relative permeability (µr) and permittivity (€r), while the impedance surfaces may have arbitrary complex impedance profiles. A special feature of SIG2D is that impedance surfaces may be co-located with discontinuities in bulk material properties.

SIG2D is formulated as coupled electric and magnetic integral equations with real electric and equivalent electric and magnetic current sources. The integral equations are solved using a Galerkin weighting procedure, which produces a symmetric set of equations and produces stable cross section solutions.

The specific code implementation in SIG2D allows for high order junctions of impedance surfaces and material discontinuity contours. This means that an arbitrary number of impedance films and dissimilar materials can meet at a point. Special logic within the code guarantees continuity of tangential field components at such junctions.

Benefits

SIG2D offers two run modes: optimizing and non-optimizing. The optimizing mode consists of a single "base matrix" run followed by any number of "impedance update" runs. Because the base matrices are saved they can be modified to re-run the code with a minimal amount of additional calculation. The design can be optimized in less time.

Product Features

• Method of Moments Solution
• Galerkin weighting
• Generalized Surface Integral Equation for bulk materials
• Symmetric matrix formulation
• Singularity extraction for accuracy
• ACAL out-of-core matrix library
• Principal Polarization Computations
• TEz, TMz
• Concurrent computation for integral re-use
• Sequential matrix solution
• Arbitrary Treatments
• Bulk dielectric, magnetic
• Graded complex R-films
• Arbitrary Topology